Invention Grant
US08227767B2 Coherent nonlinear microscopy system and method with variation of the focal volume in order to probe the nanostructure of organized materials
有权
相干非线性显微镜系统和方法与焦点体积的变化，以探索有组织的材料的纳米结构
- Patent Title: Coherent nonlinear microscopy system and method with variation of the focal volume in order to probe the nanostructure of organized materials
- Patent Title (中): 相干非线性显微镜系统和方法与焦点体积的变化，以探索有组织的材料的纳米结构
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Application No.: US13001258Application Date: 2009-06-26
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Publication No.: US08227767B2Publication Date: 2012-07-24
- Inventor: Emmanuel Jean-Marc Beaurepaire , Nicolas Olivier , Delphine Debarre , Marie-Claire Schanne-Klein , Jean-Louis Martin
- Applicant: Emmanuel Jean-Marc Beaurepaire , Nicolas Olivier , Delphine Debarre , Marie-Claire Schanne-Klein , Jean-Louis Martin
- Applicant Address: FR Palaiseau
- Assignee: Ecole Polytechnique
- Current Assignee: Ecole Polytechnique
- Current Assignee Address: FR Palaiseau
- Agency: Young & Thompson
- Priority: FR0854347 20080627
- International Application: PCT/FR2009/051236 WO 20090626
- International Announcement: WO2009/156702 WO 20091230
- Main IPC: G01N21/64
- IPC: G01N21/64
Abstract:
A method for the dimensional characterization of a structured material, in which method: an excitation laser beam suitable for coherent nonlinear microscopy is generated, this excitation laser beam being focused in a focal volume within the structured material; signals emitted by the structured material are detected; a plurality of emission patterns, each corresponding to one particular shape of the focal volume, is produced, the particular shapes being obtained for various non-Gaussian spatial profiles of the excitation laser beam wavefront; and on the basis of the emission patterns thus produced, dimensional characteristics of the structured material are deduced therefrom.
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