Invention Grant
- Patent Title: Nonvolatile semiconductor memory device
- Patent Title (中): 非易失性半导体存储器件
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Application No.: US11723481Application Date: 2007-03-20
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Publication No.: US08227863B2Publication Date: 2012-07-24
- Inventor: Shunpei Yamazaki , Yoshinobu Asami , Tamae Takano , Makoto Furuno
- Applicant: Shunpei Yamazaki , Yoshinobu Asami , Tamae Takano , Makoto Furuno
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Robinson Intellectual Property Law Office, P.C.
- Agent Eric J. Robinson
- Priority: JP2006-077893 20060321
- Main IPC: H01L29/76
- IPC: H01L29/76

Abstract:
A semiconductor layer having a channel formation region provided between a pair of impurity regions spaced from each other is provided, and a first insulating layer a floating gate, a second insulating layer, and a control gate are provided above the semiconductor layer. The semiconductor material forming the floating gate preferably has a band gap smaller than that of the semiconductor layer. The band gap of a channel formation region in the semiconductor material forming the floating gate is preferably smaller than that of the semiconductor layer by 0.1 eV or more.
Public/Granted literature
- US20070221971A1 Nonvolatile semiconductor memory device Public/Granted day:2007-09-27
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