Invention Grant
US08228054B2 Method and apparatus for amplifying a signal and test device using same
有权
使用该信号的放大信号和测试装置的方法和装置
- Patent Title: Method and apparatus for amplifying a signal and test device using same
- Patent Title (中): 使用该信号的放大信号和测试装置的方法和装置
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Application No.: US13088150Application Date: 2011-04-15
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Publication No.: US08228054B2Publication Date: 2012-07-24
- Inventor: Hong Yao
- Applicant: Hong Yao
- Applicant Address: US WA Everett
- Assignee: Fluke Corporation
- Current Assignee: Fluke Corporation
- Current Assignee Address: US WA Everett
- Agency: Christensen O'Connor Johnson Kindness PLLC
- Main IPC: G01R1/30
- IPC: G01R1/30
Abstract:
An amplifier circuit is used in a multimeter to amplify signals applied between a pair of test terminals. A voltage applied to one of the test terminals is amplified by a first operational amplifier configured as a voltage follower. An output of the first operational amplifier is applied to an inverting input of a second operational amplifier configured as an integrator. An output of the second operational amplifier is connected to the other of the test terminals. A voltage generated at the output of the second operational amplifier provides an indication of the magnitude and polarity of the voltage applied to the first and second test terminals.
Public/Granted literature
- US20110193549A1 METHOD AND APPARATUS FOR AMPLIFYING A SIGNAL AND TEST DEVICE USING SAME Public/Granted day:2011-08-11
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