Invention Grant
US08228055B2 Apparatus and method for measuring critical current properties of a coated conductor
有权
用于测量涂层导体的临界电流特性的装置和方法
- Patent Title: Apparatus and method for measuring critical current properties of a coated conductor
- Patent Title (中): 用于测量涂层导体的临界电流特性的装置和方法
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Application No.: US12560303Application Date: 2009-09-15
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Publication No.: US08228055B2Publication Date: 2012-07-24
- Inventor: Fred M. Mueller , Jens Haenisch
- Applicant: Fred M. Mueller , Jens Haenisch
- Applicant Address: US NM Los Alamos
- Assignee: Los Alamos National Security, LLC
- Current Assignee: Los Alamos National Security, LLC
- Current Assignee Address: US NM Los Alamos
- Agent Samuel L. Borkowsky
- Main IPC: G01P3/48
- IPC: G01P3/48

Abstract:
The transverse critical-current uniformity in a superconducting tape was determined using a magnetic knife apparatus. A critical current Ic distribution and transverse critical current density Jc distribution in YBCO coated conductors was measured nondestructively with high resolution using a magnetic knife apparatus. The method utilizes the strong depression of Jc in applied magnetic fields. A narrow region of low, including zero, magnetic field in a surrounding higher field is moved transversely across a sample of coated conductor. This reveals the critical current density distribution. A Fourier series inversion process was used to determine the transverse Jc distribution in the sample.
Public/Granted literature
- US20100066357A1 APPARATUS AND METHOD FOR MEASURING CRITICAL CURRENT PROPERTIES OF A COATED CONDUCTOR Public/Granted day:2010-03-18
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