Invention Grant
- Patent Title: Apparatus for detecting particle
- Patent Title (中): 用于检测颗粒的装置
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Application No.: US12857974Application Date: 2010-08-17
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Publication No.: US08228503B2Publication Date: 2012-07-24
- Inventor: Taeg-Gyum Kim , Kwang-Ho Ji
- Applicant: Taeg-Gyum Kim , Kwang-Ho Ji
- Applicant Address: KR Gyunggi-do
- Assignee: Samsung Electro-Mechanics Co., Ltd.
- Current Assignee: Samsung Electro-Mechanics Co., Ltd.
- Current Assignee Address: KR Gyunggi-do
- Agency: McDermott Will & Emery LLP
- Priority: KR10-2010-0031282 20100406
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
An apparatus for detecting a particle is disclosed. The apparatus for detecting a particle in a fluid in accordance with an embodiment of the present invention can include a first light source, which emits a first beam having a wavelength of a particular band toward the fluid, a second light source, which emits a second beam having a wavelength of a band that is different from that of the first beam, a first dichroic mirror, which is placed between the fluid and the first light source and allows the first beam to permeate and reflect the second beam toward the fluid, and a detecting unit, which detects a dispersed beam of the first beam and the second beam in the fluid. An embodiment of the invention can improve the reliability of detection by detecting a particle using a beam that has an optimal permeability according to the type of solution.
Public/Granted literature
- US20110242534A1 APPARATUS FOR DETECTING PARTICLE Public/Granted day:2011-10-06
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