Invention Grant
- Patent Title: Shape measuring device
- Patent Title (中): 形状测量装置
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Application No.: US12745546Application Date: 2008-12-02
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Publication No.: US08228509B2Publication Date: 2012-07-24
- Inventor: Masaru Akamatsu , Hidehisa Hashizume , Yasuhide Nakai
- Applicant: Masaru Akamatsu , Hidehisa Hashizume , Yasuhide Nakai
- Applicant Address: JP Kobe-Shi
- Assignee: Kobelco Research Institute, Inc.
- Current Assignee: Kobelco Research Institute, Inc.
- Current Assignee Address: JP Kobe-Shi
- Agency: Ditthavong Mori & Steiner, P.C.
- Priority: JP2007-312034 20071203
- International Application: PCT/JP2008/071902 WO 20081202
- International Announcement: WO2009/072500 WO 20090611
- Main IPC: G01B11/00
- IPC: G01B11/00

Abstract:
A shape measuring device including a light projecting device for projecting a light flux to a measurement portion, and image pickup device for picking up a projection image of the measurement portion. The light projecting device includes a collimator lens having outgoing light of a point light source pass and collimating the same in a light projection direction and one or more apertures shielding passage of light in a range outside an image pickup range or passage of light in a range inside the image pickup range and outside a boundary located in a range outside a projection image of a measurement portion. Moreover, a parallel supporting portion for supporting a face of the measurement target in parallel with the light projection direction at a position on the center side with respect to the measurement portion in the measurement target supported by a center sucking and supporting mechanism is provided.
Public/Granted literature
- US20100302551A1 SHAPE MEASURING DEVICE Public/Granted day:2010-12-02
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