Invention Grant
- Patent Title: Inverted microscope for high-contrast imaging
- Patent Title (中): 倒置显微镜用于高对比度成像
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Application No.: US12302681Application Date: 2006-05-26
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Publication No.: US08228600B2Publication Date: 2012-07-24
- Inventor: Peter Euteneuer , Ralf Krueger
- Applicant: Peter Euteneuer , Ralf Krueger
- Applicant Address: DE Wetzlar
- Assignee: Leica Microsystems CMS GmbH
- Current Assignee: Leica Microsystems CMS GmbH
- Current Assignee Address: DE Wetzlar
- Agency: Leydig, Voit & Mayer, Ltd.
- International Application: PCT/EP2006/005024 WO 20060526
- International Announcement: WO2007/137598 WO 20071206
- Main IPC: G02B21/14
- IPC: G02B21/14

Abstract:
An inverted microscope for the high-contrast imaging of objects includes multiple objectives configured to be disposable in an imaging beam path. Each objective has a respective objective pupil associated therewith. A lens system is also provided for generating respective intermediate images of the respective objective pupils. A modulator disposing device, which includes a plurality of modulators, is configured to dispose the modulators at predetermined respective locations on an optical axis corresponding to the locations of the respective intermediate images of the respective objective pupils so as to contrast an object image.
Public/Granted literature
- US20090195867A1 INVERTED MICROSCOPE Public/Granted day:2009-08-06
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