Invention Grant
US08229025B1 Method of and circuit for accepting a sample of an input signal to be used to calculate parameters for a predistortion circuit in an integrated circut 有权
用于接收用于计算集成电路中的预失真电路的参数的输入信号的采样的方法和电路

  • Patent Title: Method of and circuit for accepting a sample of an input signal to be used to calculate parameters for a predistortion circuit in an integrated circut
  • Patent Title (中): 用于接收用于计算集成电路中的预失真电路的参数的输入信号的采样的方法和电路
  • Application No.: US12201633
    Application Date: 2008-08-29
  • Publication No.: US08229025B1
    Publication Date: 2012-07-24
  • Inventor: Stephen Summerfield
  • Applicant: Stephen Summerfield
  • Applicant Address: US CA San Jose
  • Assignee: Xilinx, Inc.
  • Current Assignee: Xilinx, Inc.
  • Current Assignee Address: US CA San Jose
  • Agent John J. King
  • Main IPC: H04L25/03
  • IPC: H04L25/03
Method of and circuit for accepting a sample of an input signal to be used to calculate parameters for a predistortion circuit in an integrated circut
Abstract:
A method of accepting a sample of an input signal to be used to calculate parameters for a predistortion circuit in an integrated circuit is disclosed. The method comprises accumulating data associated with an input signal over a period of time; detecting the sample of the input signal at a predetermined time; comparing the sample of the input signal to the accumulated data; and determining whether the sample of the input signal is acceptable to be used to calculate parameters for the predistortion circuit. A circuit for accepting a sample of an input signal to be used to calculate parameters for a predistortion circuit in an integrated circuit is also disclosed.
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