Invention Grant
- Patent Title: Apparatus for measuring IQ imbalance
- Patent Title (中): IQ不平衡测量装置
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Application No.: US12034627Application Date: 2008-02-20
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Publication No.: US08229028B2Publication Date: 2012-07-24
- Inventor: Kyeongho Lee , Joonbae Park , Jeong Woo Lee , Seung-Wook Lee , Eal Wan Lee
- Applicant: Kyeongho Lee , Joonbae Park , Jeong Woo Lee , Seung-Wook Lee , Eal Wan Lee
- Applicant Address: US CA San Jose
- Assignee: GCT Semiconductor, Inc.
- Current Assignee: GCT Semiconductor, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Muir Patent Consulting, PLLC
- Main IPC: H04K1/02
- IPC: H04K1/02

Abstract:
The present invention relates to an apparatus and a method for measuring an in phase and quadrature (IQ) imbalance. One embodiment according to the present general inventive concept can provide a method for measuring a Tx IQ imbalance generated in an IQ up-conversion mixer and an Rx IQ imbalance generated in an IQ down-conversion mixer, that includes measuring a first IQ imbalance corresponding to a first combination of the Rx IQ imbalance with the Tx IQ imbalance, measuring a second IQ imbalance corresponding to a second combination of the Rx IQ imbalance with the Tx IQ imbalance and obtaining the Tx IQ imbalance and the Rx IQ imbalance from the first IQ imbalance and the second IQ imbalance.
Public/Granted literature
- US20090028231A1 APPARATUS FOR MEASURING IQ IMBALANCE Public/Granted day:2009-01-29
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