Invention Grant
US08229064B2 Localization of an element of interest by XRF analysis of different inspection volumes
有权
通过XRF对不同检验量的分析来定位感兴趣的元素
- Patent Title: Localization of an element of interest by XRF analysis of different inspection volumes
- Patent Title (中): 通过XRF对不同检验量的分析来定位感兴趣的元素
-
Application No.: US12771646Application Date: 2010-04-30
-
Publication No.: US08229064B2Publication Date: 2012-07-24
- Inventor: Lee Grodzins
- Applicant: Lee Grodzins
- Applicant Address: US MA Tewksbury
- Assignee: Thermo Scientific Portable Analytical Instruments Inc.
- Current Assignee: Thermo Scientific Portable Analytical Instruments Inc.
- Current Assignee Address: US MA Tewksbury
- Agent Gordon Stewart
- Main IPC: G01N23/223
- IPC: G01N23/223

Abstract:
An apparatus and method are disclosed for localizing an element of interest in a sample by comparing XRF spectra acquired from at least two distinct but overlapping inspection volumes. The inspection volumes are varied by changing the geometry of the exciting x-ray and/or fluoresced x-ray beam(s), which may be accomplished by repositioning multi-apertured collimators. Comparison of the XRF spectra acquired from different inspection volumes provides an indication as to whether the element of interest (e.g., lead) is present in a coating layer, in the underlying bulk material, or in both.
Public/Granted literature
- US20100278303A1 Localization of an Element of Interest by XRF Analysis of Different Inspection Volumes Public/Granted day:2010-11-04
Information query