Invention Grant
- Patent Title: X-ray inspection device
- Patent Title (中): X光检查装置
-
Application No.: US12774922Application Date: 2010-05-06
-
Publication No.: US08229065B2Publication Date: 2012-07-24
- Inventor: Katsunori Izutsu
- Applicant: Katsunori Izutsu
- Applicant Address: JP Kyoto
- Assignee: Ishida Co., Ltd.
- Current Assignee: Ishida Co., Ltd.
- Current Assignee Address: JP Kyoto
- Agency: Global IP Counselors, LLP
- Priority: JP2009-116105 20090513; JP2010-033442 20100218
- Main IPC: G01N23/04
- IPC: G01N23/04

Abstract:
An X-ray inspection device is adapted to detect foreign matter in a target object while the target object is conveyed. The X-ray inspection device includes an X-ray emission device, a scintillator unit, a slit member and a photodiode array. The scintillator unit extends in a direction that intersects a conveyance direction of the target object, and is configured and arranged to optically convert the X-rays emitted by the X-ray emission device into visible light. The slit member forms a slit that extends in the direction that intersects the conveyance direction, and is disposed on an upstream side of the scintillator unit with respect to a direction of X-ray irradiation. The slit member is arranged so that a width of the slit is narrower than a width of the scintillator unit, and is equal to or wider than half a light-receiving width of the photodiode array in the conveyance direction.
Public/Granted literature
- US20100290589A1 X-RAY INSPECTION DEVICE Public/Granted day:2010-11-18
Information query