Invention Grant
- Patent Title: Feature information collecting apparatus and feature information collecting method
- Patent Title (中): 特征信息采集装置和特征信息采集方法
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Application No.: US12076068Application Date: 2008-03-13
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Publication No.: US08229169B2Publication Date: 2012-07-24
- Inventor: Masaki Nakamura , Koichi Nakao , Motoki Kanba
- Applicant: Masaki Nakamura , Koichi Nakao , Motoki Kanba
- Applicant Address: JP Anjo
- Assignee: Aisin AW Co., Ltd.
- Current Assignee: Aisin AW Co., Ltd.
- Current Assignee Address: JP Anjo
- Agency: Oliff & Berridge, PLC
- Priority: JP2007-091323 20070330
- Main IPC: G06K9/46
- IPC: G06K9/46

Abstract:
Feature information collecting apparatuses, methods, and programs acquire vehicle position information that represents the current position of a vehicle, acquire image information for a vicinity of the vehicle, and carry out image recognition processing on recognition target objects that are included in the image information. The apparatuses, methods, and programs store recognition information in a memory that represents a result of the image recognition of the recognition target objects in association with information for the recognition position of the recognition target objects, the recognition position determined based on the vehicle position information. The apparatuses, methods, and programs extract, as learned features, recognition target objects that can be repeatedly recognized by image recognition based on a plurality of sets of recognition information related to the same position, the plurality of sets of recognition information being stored due to the image information for the same position being recognized a plurality of times by image recognition.
Public/Granted literature
- US20080240573A1 Feature information collecting apparatus and feature information collecting method Public/Granted day:2008-10-02
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