Invention Grant
- Patent Title: Abnormality detection system and method of detecting abnormality
- Patent Title (中): 异常检测系统及异常检测方法
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Application No.: US11653258Application Date: 2007-01-16
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Publication No.: US08229584B2Publication Date: 2012-07-24
- Inventor: Masanobu Higashide , Gouki Sadakuni
- Applicant: Masanobu Higashide , Gouki Sadakuni
- Applicant Address: JP Kanagawa JP Tokyo
- Assignee: Renesas Electronics Corporation,NEC Corporation
- Current Assignee: Renesas Electronics Corporation,NEC Corporation
- Current Assignee Address: JP Kanagawa JP Tokyo
- Agency: Young & Thompson
- Priority: JP2006-007403 20060116
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G06F11/30 ; G01R31/00 ; G01N37/00

Abstract:
An abnormality detection system includes a measurement unit, a decision unit, an alarm unit, and storage units, and serves to detect the abnormality in a control characteristic value of a plurality of products manufactured on the same production line. The decision unit receives the control characteristic value stored in the storage unit, and decides whether an abnormality exists, based on that value. More specifically, the decision unit decides that the control characteristic value is abnormal when, with respect to m (m is a natural number) pieces of the products that are consecutively manufactured, an absolute value of a difference in control characteristic value between each of the products and another manufactured immediately before the former is equal to or less than a predetermined constant.
Public/Granted literature
- US20070203603A1 Abnormality detection system and method of detecting abnormality Public/Granted day:2007-08-30
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