Invention Grant
- Patent Title: Extended single-bit error correction and multiple-bit error detection
- Patent Title (中): 扩展单位纠错和多位错误检测
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Application No.: US12417390Application Date: 2009-04-02
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Publication No.: US08230305B2Publication Date: 2012-07-24
- Inventor: David R. Resnick
- Applicant: David R. Resnick
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman, Lundberg, & Woessner, P.A.
- Main IPC: H03M13/00
- IPC: H03M13/00
Abstract:
Some embodiments include apparatus and methods to prevent at least one of misidentifying and ignoring multiple-bit errors if the multiple-bit errors include a plurality of erroneous data bits that belong to only one specific group of a plurality of groups of data bits and if none of the other groups of the plurality of groups have errors.
Public/Granted literature
- US20100257432A1 EXTENDED SINGLE-BIT ERROR CORRECTION AND MULTIPLE-BIT ERROR DETECTION Public/Granted day:2010-10-07
Information query
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