Invention Grant
- Patent Title: Testing and debugging of dynamic binary translation
- Patent Title (中): 动态二进制翻译的测试和调试
-
Application No.: US11865024Application Date: 2007-09-30
-
Publication No.: US08230402B2Publication Date: 2012-07-24
- Inventor: William Y. Chen , Jiwei Lu , Geetha K. Vallabhaneni
- Applicant: William Y. Chen , Jiwei Lu , Geetha K. Vallabhaneni
- Applicant Address: US CA Redwood City
- Assignee: Oracle America, Inc.
- Current Assignee: Oracle America, Inc.
- Current Assignee Address: US CA Redwood City
- Agency: Brooks Kushman P.C.
- Main IPC: G06F9/45
- IPC: G06F9/45

Abstract:
A method for testing and debugging of dynamic binary translation wherein a dynamic binary translator allows a target binary to be executed transparently on a host machine having a different computer architecture than the target machine involves selecting a minimum set of target machine states for simulation at run-time. A series of target machine instructions from the target binary is translated into a series of host machine instructions. During translation, a plurality of check points are inserted into the series of host machine instructions. During translation, a plurality of verification points are inserted into the series of host machine instructions. The series of host machine instructions, including the check points and verification points, are executed. Execution of a check point determines a simulated target machine state. Execution of a verification point sends information pertaining to simulated target machine states to an external verifier.
Public/Granted literature
- US20090089758A1 TESTING AND DEBUGGING OF DYNAMIC BINARY TRANSLATION Public/Granted day:2009-04-02
Information query