Invention Grant
- Patent Title: Particle beam irradiation system and method for controlling the particle beam irradiation system
- Patent Title (中): 粒子束照射系统及粒子束照射系统的控制方法
-
Application No.: US13058963Application Date: 2010-05-27
-
Publication No.: US08232536B2Publication Date: 2012-07-31
- Inventor: Hisashi Harada
- Applicant: Hisashi Harada
- Applicant Address: JP Chiyoda-Ku, Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Chiyoda-Ku, Tokyo
- Agency: Buchanan Ingersoll & Rooney PC
- International Application: PCT/JP2010/058979 WO 20100527
- International Announcement: WO2011/148486 WO 20111201
- Main IPC: H01J37/09
- IPC: H01J37/09 ; G21K5/04

Abstract:
There is provided a particle beam irradiation system so as to provide the dose distribution having more accuracy. An irradiation control part comprises an energy setting controller that sets the energy of a charged particle beam, a beam scanning controller that controls a beam scanner, and a beam diameter changer to control a beam diameter changer, wherein the irradiation control part sets a beam diameter of the charged particle beam to be a first beam diameter by the beam diameter changer, the charged particle beam is scanned step-wise by the beam scanning controller so as to irradiate the charged particle beam on a predetermined region of the irradiation target, after that, the beam diameter of the charged particle beam is set by the beam diameter controller to be a second beam diameter that is different from the first beam diameter, and the charged particle beam is scanned step-wise by the beam scan controller so as to control the charged particle beam to irradiate on a region that is overlapped with at least a part of the predetermined part of the irradiation target.
Public/Granted literature
- US20120056098A1 PARTICLE BEAM IRRADIATION SYSTEM AND METHOD FOR CONTROLLING THE PARTICLE BEAM IRRADIATION SYSTEM Public/Granted day:2012-03-08
Information query