Invention Grant
- Patent Title: Switch circuit, filter circuit and test apparatus
- Patent Title (中): 开关电路,滤波电路及测试仪器
-
Application No.: US12207506Application Date: 2008-09-10
-
Publication No.: US08232808B2Publication Date: 2012-07-31
- Inventor: Hiroki Kimura , Chisato Maeda
- Applicant: Hiroki Kimura , Chisato Maeda
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Osha Liang LLP
- Priority: JP2006-131812 20060510
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
There is provided a switch circuit for switching whether to output an input signal, including: a transmission path that transmits the input signal from an input end to an output end of the switch circuit; a first semiconductor switch that is provided on the transmission path and switches whether to transmit the input signal; a second semiconductor switch that is opened when the first semiconductor switch is short-circuited, and that is short-circuited when the first semiconductor switch is opened, thereby grounding, to a ground potential, a high-frequency signal leaked to the transmission path between the first semiconductor switch and the output end; and a voltage controller that causes a potential difference on both ends of the second semiconductor switch when the second semiconductor switch is opened.
Public/Granted literature
- US20090230978A1 SWITCH CIRCUIT, FILTER CIRCUIT AND TEST APPARATUS Public/Granted day:2009-09-17
Information query