Invention Grant
- Patent Title: X-ray diagnostic device
- Patent Title (中): X光诊断装置
-
Application No.: US12867231Application Date: 2008-04-14
-
Publication No.: US08233585B2Publication Date: 2012-07-31
- Inventor: Katsuhiro Masuo
- Applicant: Katsuhiro Masuo
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: DLA Piper LLP (US)
- International Application: PCT/JP2008/057260 WO 20080414
- International Announcement: WO2009/128129 WO 20091022
- Main IPC: A61B6/00
- IPC: A61B6/00

Abstract:
In a precessional operation where an X-ray irradiation means and a two-dimensional radiation detector are moving on a circular or elliptic orbit respectively by rotating either one of holding means, that is a C arm or a holding means at angular rate of a·sin(t) under a steady state condition and by rotating the other holding means at angular rate of b·cos(t), the operation is carried out at angular rate (f(t), g(t)) to ensure that the maximum acceleration is smaller than the steady state acceleration during a running-up period until steady is reached.
Public/Granted literature
- US20110064187A1 X-RAY DIAGNOSTIC DEVICE Public/Granted day:2011-03-17
Information query