Invention Grant
- Patent Title: Specimen analyzing apparatus and specimen analyzing method
- Patent Title (中): 标本分析仪器和样本分析方法
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Application No.: US12607739Application Date: 2009-10-28
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Publication No.: US08234941B2Publication Date: 2012-08-07
- Inventor: Kazuya Fukuda , Hiroki Koike , Hironori Katsumi , Takashi Yamato , Masayuki Ikeda , Tsuyoshi Fukuzaki , Daisuke Nakano , Masanori Imazu , Nobuhiro Kitagawa
- Applicant: Kazuya Fukuda , Hiroki Koike , Hironori Katsumi , Takashi Yamato , Masayuki Ikeda , Tsuyoshi Fukuzaki , Daisuke Nakano , Masanori Imazu , Nobuhiro Kitagawa
- Applicant Address: JP Kobe
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe
- Agency: Sughrue Mion, PLLC
- Priority: JP2008-281585 20081031; JP2009-065641 20090318
- Main IPC: G01N35/00
- IPC: G01N35/00 ; G01N35/02 ; G01N35/10

Abstract:
A specimen analyzing apparatus comprising: a detector for detecting component information regarding a component in a specimen contained in each of analyzing containers, the analyzing containers comprising first and second analyzing containers; an analyzing part for analyzing the component information detected by the detector; a transporting device for transporting specimen containers each containing a specimen, the specimen containers comprising first and second specimen containers; an operation mode selector for selecting one of a first operation mode and a second operation mode; a first supplying device for supplying the specimen of a first amount; a second supplying device for supplying the specimen of a second amount grater than the first amount; and a supply controller for controlling the first and second supplying devices in accordance with an operation mode selected by the operation mode selector, is disclosed. A specimen analyzing method is also disclosed.
Public/Granted literature
- US20100107744A1 SPECIMEN ANALYZING APPARATUS AND SPECIMEN ANALYZING METHOD Public/Granted day:2010-05-06
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