Invention Grant
US08236103B2 Group III nitride semiconductor crystal, production method thereof and group III nitride semiconductor epitaxial wafer 有权
III族氮化物半导体晶体,其制造方法和III族氮化物半导体外延片

  • Patent Title: Group III nitride semiconductor crystal, production method thereof and group III nitride semiconductor epitaxial wafer
  • Patent Title (中): III族氮化物半导体晶体,其制造方法和III族氮化物半导体外延片
  • Application No.: US10504584
    Application Date: 2003-02-14
  • Publication No.: US08236103B2
    Publication Date: 2012-08-07
  • Inventor: Hisayuki MikiTetsuo SakuraiMineo Okuyama
  • Applicant: Hisayuki MikiTetsuo SakuraiMineo Okuyama
  • Applicant Address: JP Tokyo
  • Assignee: Showa Denko K.K.
  • Current Assignee: Showa Denko K.K.
  • Current Assignee Address: JP Tokyo
  • Agency: Sughrue Mion, PLLC
  • Priority: JP2002-38841 20020215
  • International Application: PCT/JP03/01558 WO 20030214
  • International Announcement: WO03/068699 WO 20030821
  • Main IPC: C30B23/00
  • IPC: C30B23/00
Group III nitride semiconductor crystal, production method thereof and group III nitride semiconductor epitaxial wafer
Abstract:
A method for producing a Group III nitride semiconductor crystal includes a first step of supplying a Group III raw material and a Group V raw material at a V/III ratio of 0 to 1,000 to form and grow a Group III nitride semiconductor on a heated substrate and a second step of vapor-phase-growing a Group III nitride semiconductor crystal on the substrate using a Group III raw material and a nitrogen raw material.
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