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US08237113B2 Preparation of a matrix layer for spectrometry 有权
制备用于光谱测定的基质层

Preparation of a matrix layer for spectrometry
Abstract:
The invention relates to preparing a matrix layer on a sample support for mass spectrometric analysis. An aspect of the invention includes detecting a light signal that is attenuated, reflected or scattered by the matrix layer, and using the light signal to examine the matrix layer or to regulate the preparation of the matrix layer.
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