Invention Grant
- Patent Title: Sample target used in mass spectrometry, method for producing the same, and mass spectrometer using the sample target
- Patent Title (中): 用于质谱的样品靶,其制备方法和使用样品靶的质谱仪
-
Application No.: US11988166Application Date: 2006-04-28
-
Publication No.: US08237114B2Publication Date: 2012-08-07
- Inventor: Shoji Okuno , Yoshinao Wada , Takashi Yanagishita , Hideki Masuda
- Applicant: Shoji Okuno , Yoshinao Wada , Takashi Yanagishita , Hideki Masuda
- Applicant Address: JP Saitama
- Assignee: Japan Science & Technology Agency
- Current Assignee: Japan Science & Technology Agency
- Current Assignee Address: JP Saitama
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JP2005-306386 20051020
- International Application: PCT/JP2006/309032 WO 20060428
- International Announcement: WO2007/046162 WO 20070426
- Main IPC: H01J49/26
- IPC: H01J49/26

Abstract:
In one embodiment of the present invention, a sample target that allows ionization of a substance whose molecular weight is so high as to exceed 10000 in mass spectrometry that ionizes a sample without using matrix, a method for producing the same and a mass spectrometer using the sample target. The sample target includes a sample support surface including a large number of fine pores on its face receiving irradiated laser light. Each of the fine pores has a diameter of 30 nm or more and 5 μm or less. The number indicative of pore depth/(pore cycle−pore diameter) of each of the fine pores is 2 or more and 50 or less. The face of the sample support surface is coated with metal or semiconductor.
Public/Granted literature
Information query