Invention Grant
- Patent Title: Particle detection system
- Patent Title (中): 粒子检测系统
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Application No.: US12764890Application Date: 2010-04-21
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Publication No.: US08237125B2Publication Date: 2012-08-07
- Inventor: Yi-Xiang Wang , Joe Wang
- Applicant: Yi-Xiang Wang , Joe Wang
- Applicant Address: TW Hsin-Chu
- Assignee: Hermes Microvision, Inc.
- Current Assignee: Hermes Microvision, Inc.
- Current Assignee Address: TW Hsin-Chu
- Agency: Stout, Uxa, Buyan & Mullins, LLP
- Main IPC: G01T1/28
- IPC: G01T1/28
Abstract:
This invention provides a design to process a large range of detection beam current at low noise with a single detector. With such a design, the detection system can generate up to 1010 gain and maximum signal output at more than mini Ampere (mA) level.
Public/Granted literature
- US20110260069A1 PARTICLE DETECTION SYSTEM Public/Granted day:2011-10-27
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