Invention Grant
- Patent Title: X-ray imaging device and method for the manufacturing thereof
- Patent Title (中): X射线成像装置及其制造方法
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Application No.: US12193011Application Date: 2008-08-17
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Publication No.: US08237126B2Publication Date: 2012-08-07
- Inventor: Hans Von Känel , Rolf Kaufmann
- Applicant: Hans Von Känel , Rolf Kaufmann
- Applicant Address: CH Neuchatel CH Zurich
- Assignee: CSEM Centre Suisse d'Electronique et de Mictrotechnique SA,Epispeed
- Current Assignee: CSEM Centre Suisse d'Electronique et de Mictrotechnique SA,Epispeed
- Current Assignee Address: CH Neuchatel CH Zurich
- Agency: Fleit Gibbons Gutman Bongini & Bianco PL
- Agent Martin Fleit; Paul D. Bianco
- Main IPC: H01L27/146
- IPC: H01L27/146 ; H01L27/14 ; H01L31/062

Abstract:
The present invention discloses an X-ray imaging device comprising an X-ray absorber that comprises a plurality of semiconductor layers. The plurality of semiconductor layers comprise a substrate having a backside; and at least one absorption layer adapted to absorb at least one X-ray photon impinging on the at least one absorption layer that is adapted to correspondingly generate in response to the at least one impinging X-ray photon at least one electron-hole pair; and a readout unit, wherein the readout unit is operatively coupled to the X-ray absorber such to enable readout of the at least one electron-hole pair. Additional and alternative embodiments are described and claimed.
Public/Granted literature
- US20090045346A1 X-RAY IMAGING DEVICE AND METHOD FOR THE MANUFACTURING THEREOF Public/Granted day:2009-02-19
Information query
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