Invention Grant
US08237284B2 Contact plug of semiconductor device and method of forming the same
有权
半导体器件的接触插塞及其形成方法
- Patent Title: Contact plug of semiconductor device and method of forming the same
- Patent Title (中): 半导体器件的接触插塞及其形成方法
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Application No.: US12163735Application Date: 2008-06-27
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Publication No.: US08237284B2Publication Date: 2012-08-07
- Inventor: Jung Woong Lee
- Applicant: Jung Woong Lee
- Applicant Address: KR Icheon-si
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Icheon-si
- Agency: Kilpatrick Townsend & Stockton LLP
- Priority: KR10-2007-0118590 20071120
- Main IPC: H01L21/44
- IPC: H01L21/44 ; H01L23/48

Abstract:
The present invention relates to a contact plug of a semiconductor device and a method of forming the same. The method includes forming an insulating layer over a semiconductor substrate, forming contact holes in the insulating layer, forming a first conductive layer over the insulating layer including the contact holes, etching the first conductive layer so that the first conductive layer remains at lower portions of the contact holes, wherein the insulating layer is also etched in order to widen upper widths of the contact holes, and forming a second conductive layer over the first conductive layer of the contact holes, thus forming the contact plugs.
Public/Granted literature
- US20090127714A1 CONTACT PLUG OF SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME Public/Granted day:2009-05-21
Information query
IPC分类: