Invention Grant
- Patent Title: Contactor, probe card, and method of mounting contactor
- Patent Title (中): 接触器,探针卡和安装接触器的方法
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Application No.: US12670247Application Date: 2007-07-24
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Publication No.: US08237461B2Publication Date: 2012-08-07
- Inventor: Hidenori Kitazume , Koji Asano
- Applicant: Hidenori Kitazume , Koji Asano
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Greenblum & Bernstein, P.L.C.
- International Application: PCT/JP2007/064490 WO 20070724
- International Announcement: WO2009/013809 WO 20090129
- Main IPC: G01R31/00
- IPC: G01R31/00

Abstract:
A contactor includes conductive parts for electrical connection with input/output terminals of an IC device; beam parts with the conductive part provided on their main surfaces; and a base part supporting the beam parts in a cantilever manner, the base part has a support region supporting the beam parts and mark formation regions at which first positioning marks are provided, and weakened parts relatively weaker in strength than other parts of the base part are provided between the support region and mark formation regions.
Public/Granted literature
- US20100194420A1 CONTACTOR, PROBE CARD, AND METHOD OF MOUNTING CONTACTOR Public/Granted day:2010-08-05
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