Invention Grant
- Patent Title: Optical time domain reflectometer and method for testing optical fiber using optical pulse
- Patent Title (中): 光时域反射计和光脉冲光纤测试方法
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Application No.: US11991373Application Date: 2007-06-20
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Publication No.: US08237921B2Publication Date: 2012-08-07
- Inventor: Shigeo Hori
- Applicant: Shigeo Hori
- Applicant Address: JP Atsugi-Shi
- Assignee: Anritsu Corporation
- Current Assignee: Anritsu Corporation
- Current Assignee Address: JP Atsugi-Shi
- Agency: Holtz, Holtz, Goodman & Chick, PC
- Priority: JP2006-183488 20060703
- International Application: PCT/JP2007/062403 WO 20070620
- International Announcement: WO2008/004443 WO 20080110
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
At the time of real-time measurement, when a measurement position is specified by a marker, a marker level acquiring section acquires a waveform level from waveform data stored in a waveform memory. A level comparing section determines whether the waveform level acquired by the marker level acquiring section falls within an effective measurement level range preset correspondingly with attenuator (ATT) values. When the level comparing section determines that the waveform level does not fall within the effective measurement level range, an ATT value change section changes the ATT values into new ATT values at which a waveform level falls within the corresponding effective measurement level range. A control section allows a measured optical fiber to be measured based on the new ATT value, so as to enable waveform measurement with a good S/N ratio of not less than a predetermined value based on a measurement waveform displayed on a screen of a display section.
Public/Granted literature
- US20100271622A1 Optical time domain reflectometer and method for testing optical fiber using optical pulse Public/Granted day:2010-10-28
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