Invention Grant
- Patent Title: Memory voltage cycle adjustment
- Patent Title (中): 内存电压周期调整
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Application No.: US13162633Application Date: 2011-06-17
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Publication No.: US08238167B2Publication Date: 2012-08-07
- Inventor: Seiichi Aritome
- Applicant: Seiichi Aritome
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G11C16/04
- IPC: G11C16/04

Abstract:
The present disclosure includes various method, device, system, and module embodiments for memory cycle voltage adjustment. One such method embodiment includes counting a number of process cycles performed on a first memory block in a memory device. This method embodiment also includes adjusting at least one program voltage, from an initial program voltage to an adjusted voltage, in response to the counted number of process cycles.
Public/Granted literature
- US20110255342A1 MEMORY VOLTAGE CYCLE ADJUSTMENT Public/Granted day:2011-10-20
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