Invention Grant
- Patent Title: IQ impairment estimation in an OFDM signal
- Patent Title (中): OFDM信号中的IQ损伤估计
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Application No.: US12684466Application Date: 2010-01-08
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Publication No.: US08238458B2Publication Date: 2012-08-07
- Inventor: Prakash Sethia , Ramesh Krishnan , Nikhil Deshmukh
- Applicant: Prakash Sethia , Ramesh Krishnan , Nikhil Deshmukh
- Applicant Address: US TX Austin
- Assignee: National Instruments Corporation
- Current Assignee: National Instruments Corporation
- Current Assignee Address: US TX Austin
- Agency: Meyertons Hood Kivlin Kowert & Goetzel, P.C.
- Agent Jeffrey C. Hood
- Main IPC: H04L27/28
- IPC: H04L27/28

Abstract:
System and method for evaluating a transmitter by estimating IQ impairments in an orthogonal frequency division multiplexed (OFDM) signal generated by the transmitter. The OFDM signal may be received. The OFDM signal may represent a stream of symbols, each comprising a plurality of subcarriers. At least a subset of the subcarriers may be pilot subcarriers. The pilot subcarriers may be grouped into one or more groups of pilot subcarriers based on one or more conditions: a pilot subcarrier which satisfies a condition in its relation to a mirror subcarrier may be grouped with other pilot subcarriers which also satisfy the condition in relation to mirror subcarriers. An estimate of one or more of gain imbalance or quadrature skew of the OFDM signal may be calculated based on the one or more groups of pilot subcarriers and the one or more conditions. The estimate may be used to evaluate the transmitter.
Public/Granted literature
- US20110103496A1 IQ Impairment Estimation in an OFDM Signal Public/Granted day:2011-05-05
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