Invention Grant
- Patent Title: Methods and apparatus for measuring 3D dimensions on 2D images
- Patent Title (中): 用于测量2D图像上的3D尺寸的方法和装置
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Application No.: US12274687Application Date: 2008-11-20
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Publication No.: US08238642B2Publication Date: 2012-08-07
- Inventor: Yanyan Wu , Donald Robert Howard , Harry Israel Ringermacher , Robert August Kaucic , Zhaohui Sun , Francis Howard Little , Xiaodong Tao , Patrick Joseph Howard , Matthew Edward Dragovich , Eric Scott Foster
- Applicant: Yanyan Wu , Donald Robert Howard , Harry Israel Ringermacher , Robert August Kaucic , Zhaohui Sun , Francis Howard Little , Xiaodong Tao , Patrick Joseph Howard , Matthew Edward Dragovich , Eric Scott Foster
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Penny A. Clarke
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/20

Abstract:
A method for determining 3D distances on a 2D pixelized image of a part or object includes acquiring a real 2D pixelized image of the object, creating a simulated image of the object using the 3D CAD model and the 2D pixelized image, determining a specified cost function comparing the simulated image with the real 2D pixilated image and repositioning the simulated image in accordance with iterated adjustments of a relative position between the CAD model and the 2D pixilated image to change the simulated image until the specified cost function is below a specified value. Then, the workstation is used to generate a 3D distance scale matrix using the repositioned simulated image, and to measure and display distances between selected pixels on a surface of the real image using 2D distances on the 2D pixelized image of the object and the 3D distance scale matrix.
Public/Granted literature
- US20100124369A1 METHODS AND APPARATUS FOR MEASURING 3D DIMENSIONS ON 2D IMAGES Public/Granted day:2010-05-20
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