Invention Grant
- Patent Title: Pattern identification apparatus and method thereof, abnormal pattern detection apparatus and method thereof, and program
- Patent Title (中): 模式识别装置及其方法,异常模式检测装置及其方法和程序
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Application No.: US12100664Application Date: 2008-04-10
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Publication No.: US08238673B2Publication Date: 2012-08-07
- Inventor: Yusuke Mitarai , Masakazu Matsugu
- Applicant: Yusuke Mitarai , Masakazu Matsugu
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Cowan, Liebowitz & Latman, P.C.
- Priority: JP2007-104212 20070411
- Main IPC: G06K9/70
- IPC: G06K9/70

Abstract:
A pattern identification apparatus for identifying one of a plurality of classes defined in advance, to which data of a pattern identification target belongs, comprises a read unit adapted to read out, from a storage unit in correspondence with each of the plurality of classes, a projection rule to a hyperplane which approximates a manifold corresponding to the class in a feature space an input unit adapted to input identification target data; a calculation unit adapted to calculate, for each class, a projection result obtained by projecting the input identification target data to the hyperplane which approximates the manifold corresponding to each of the plurality of classes, on the basis of the projection rule; and an identification unit adapted to identify, on the basis of the projection result of each classes calculated by said calculation unit, one of the plurality of classes to which the identification target data belongs.
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