Invention Grant
- Patent Title: Optical measuring probe for process monitoring
- Patent Title (中): 用于过程监控的光学测量探头
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Application No.: US12375496Application Date: 2007-07-20
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Publication No.: US08238698B2Publication Date: 2012-08-07
- Inventor: Stephan Tosch , Reinhard Gross , Marcus Brand , Hans Tups
- Applicant: Stephan Tosch , Reinhard Gross , Marcus Brand , Hans Tups
- Applicant Address: DE Leverkusen
- Assignee: Bayer Technology Services GmbH
- Current Assignee: Bayer Technology Services GmbH
- Current Assignee Address: DE Leverkusen
- Agency: Norris McLaughlin & Marcus, P.A.
- Priority: DE102006035996 20060802
- International Application: PCT/EP2007/006494 WO 20070720
- International Announcement: WO2008/014901 WO 20080207
- Main IPC: G02B6/00
- IPC: G02B6/00 ; G01N21/00

Abstract:
The invention relates to an optical measurement probe for process monitoring, having a distal end, arranged in the region of a process apparatus, with a light entrance opening, and a proximal end coupled to a spectrometer, wherein a shaft comprising a light-guiding connection between the distal and proximal ends of the measurement probe is arranged between the two ends. The measurement probe is characterized in that the measurement probe has, in its distal region relative to the shaft and/or the proximal end, a reduced external diameter (FIG. 1).
Public/Granted literature
- US20090201493A1 OPTICAL MEASURING PROBE FOR PROCESS MONITORING Public/Granted day:2009-08-13
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