Invention Grant
- Patent Title: Miniaturized inertial measurement unit and associated methods
- Patent Title (中): 小型化惯性测量单元及相关方法
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Application No.: US12431132Application Date: 2009-04-28
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Publication No.: US08239162B2Publication Date: 2012-08-07
- Inventor: Martin E. Tanenhaus
- Applicant: Martin E. Tanenhaus
- Applicant Address: US MD Annapolis
- Assignee: Tanenhaus & Associates, Inc.
- Current Assignee: Tanenhaus & Associates, Inc.
- Current Assignee Address: US MD Annapolis
- Agency: GrayRobinson, P.A.
- Agent Carl M. Napolitano
- Main IPC: G01C9/00
- IPC: G01C9/00

Abstract:
An inertial measurement unit includes a base having a plurality of physically distinct sectors, upon which are positioned thereon three groups of orthogonally oriented angle rate sensors, each group positioned on a different sector of the base. Three high-G orthogonally oriented accelerometers are also positioned on the base, as well as three low-G orthogonally oriented accelerometers. A processor is positioned on the base having software resident thereon for receiving signals from the three groups of angle rate sensors and the three high-G and three low-G accelerometers. Software is also resident on the processor for calculating from the received signals one or more of the following: a change in attitude, a change in position, a change in angular rate, a change in velocity, and a change in acceleration of the unit over a plurality of finite time increments. Preferably, each gyro is subjected to oversampling, temperature and bias compensation, and bias offset compensation.
Public/Granted literature
- US20090326851A1 Miniaturized Inertial Measurement Unit and Associated Methods Public/Granted day:2009-12-31
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