Invention Grant
US08239794B2 System and method for estimating leakage current of an electronic circuit
有权
用于估计电子电路的漏电流的系统和方法
- Patent Title: System and method for estimating leakage current of an electronic circuit
- Patent Title (中): 用于估计电子电路的漏电流的系统和方法
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Application No.: US12568985Application Date: 2009-09-29
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Publication No.: US08239794B2Publication Date: 2012-08-07
- Inventor: Bhavna Agrawal , David J. Hathaway , Pravin P. Kamdar , Karl K. Moody, III , Peng Peng , David W. Winston
- Applicant: Bhavna Agrawal , David J. Hathaway , Pravin P. Kamdar , Karl K. Moody, III , Peng Peng , David W. Winston
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Gibb & Riley, LLC
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06F17/10

Abstract:
Disclosed are embodiments of a system and of an associated method for estimating the leakage current of an electronic circuit. The embodiments analyze a layout of an electronic circuit in order to identify all driven and non-driven nets within the electronic circuit, to identify all of the driven net-bounded partitions within the electronic circuit (based on the driven and non-driven nets), and to identify, for each driven net-bounded partition, all possible states of the electronic circuit that can leak. Then, using this information, the embodiments estimate the leakage current of the electronic circuit. This is accomplished by first determining, for each state of each driven net-bounded partition, a leakage current of the driven net-bounded partition and a probability that the state will occur in the driven net-bounded partition during operation of the electronic circuit. Then, for each state of each driven net-bounded partition, the leakage current of the driven net-bounded partition and the state probability are multiplied together. The results are then aggregated.
Public/Granted literature
- US20110077882A1 SYSTEM AND METHOD FOR ESTIMATING LEAKAGE CURRENT OF AN ELECTRONIC CIRCUIT Public/Granted day:2011-03-31
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