Invention Grant
US08243174B2 Defect pixel detection apparatus and method for detecting defect pixel
有权
缺陷像素检测装置和缺陷像素检测方法
- Patent Title: Defect pixel detection apparatus and method for detecting defect pixel
- Patent Title (中): 缺陷像素检测装置和缺陷像素检测方法
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Application No.: US12544691Application Date: 2009-08-20
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Publication No.: US08243174B2Publication Date: 2012-08-14
- Inventor: Shigeru Ichikawa
- Applicant: Shigeru Ichikawa
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Carter, DeLuca, Farrell & Schmidt LLP
- Priority: JP2008-222462 20080829
- Main IPC: H04N9/64
- IPC: H04N9/64

Abstract:
A defect pixel detection apparatus includes an image sensor which includes an effective pixel configured to have a photoelectric conversion element and an output unit configured to output a pixel signal generated by the photoelectric conversion element, a first reference pixel configured to have the same pixel configuration as the effective pixel and be optically shielded, and a second reference pixel configured to have a pixel configuration different from that of the effective pixel, a defect level acquiring unit configured to acquire a defect level of a target pixel in the image sensor, and a defect pixel determination unit configured to determine whether the target pixel is a defect pixel by comparing a defect level of the target pixel with a defect detection threshold according to a type of the pixel.
Public/Granted literature
- US20100053383A1 DEFECT PIXEL DETECTION APPARATUS AND METHOD FOR DETECTING DEFECT PIXEL Public/Granted day:2010-03-04
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