Invention Grant
US08243174B2 Defect pixel detection apparatus and method for detecting defect pixel 有权
缺陷像素检测装置和缺陷像素检测方法

Defect pixel detection apparatus and method for detecting defect pixel
Abstract:
A defect pixel detection apparatus includes an image sensor which includes an effective pixel configured to have a photoelectric conversion element and an output unit configured to output a pixel signal generated by the photoelectric conversion element, a first reference pixel configured to have the same pixel configuration as the effective pixel and be optically shielded, and a second reference pixel configured to have a pixel configuration different from that of the effective pixel, a defect level acquiring unit configured to acquire a defect level of a target pixel in the image sensor, and a defect pixel determination unit configured to determine whether the target pixel is a defect pixel by comparing a defect level of the target pixel with a defect detection threshold according to a type of the pixel.
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