Invention Grant
- Patent Title: Atomic force microscope
- Patent Title (中): 原子力显微镜
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Application No.: US12541867Application Date: 2009-08-14
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Publication No.: US08245317B2Publication Date: 2012-08-14
- Inventor: Mahito Negishi
- Applicant: Mahito Negishi
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2006-038779 20060216
- Main IPC: G01B5/28
- IPC: G01B5/28 ; G01Q60/24 ; G01Q60/38

Abstract:
A surface shape of a member to be measured is measured by reflecting measuring light at a reflection surface of a probe and utilizing an atomic force exerting between the probe and utilizing an atomic force exerting between the probe and the member to be measured. In addition to a first scanner for driving the probe, a second scanner for moving a focus position of an optical system is provided. Position conversion data representing a correlation between amounts of control of the first scanner and the second scanner are obtained in advance. By synchronously driving the first scanner and the second scanner, the focus position of the optical system is caused to follow the probe to improve measurement accuracy.
Public/Granted literature
- US20090300806A1 ATOMIC FORCE MICROSCOPE Public/Granted day:2009-12-03
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