Invention Grant
- Patent Title: Disk surface inspection apparatus, inspection system thereof, and inspection method thereof
- Patent Title (中): 磁盘表面检查装置及其检查系统及其检查方法
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Application No.: US12694297Application Date: 2010-01-27
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Publication No.: US08253935B2Publication Date: 2012-08-28
- Inventor: Tatsuo Hariyama , Hideaki Sasazawa , Minoru Yoshida , Shigeru Serikawa
- Applicant: Tatsuo Hariyama , Hideaki Sasazawa , Minoru Yoshida , Shigeru Serikawa
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- Priority: JP2009-028453 20090210
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
The invention has a function of preparing a data base for a relation between a defect shape and an arrangement for the optical system capable of detecting the shape at high sensitivity and automatically adjusting the arrangement for the optical system. As the method of preparing the data base, a method of using optical simulation or an experimental method of using a sample having an optical shape is applied. A pinhole position and a beam size are adjusted automatically so as to attain the optimal arrangement for the optical system to an inputted defect shape based on the data base.
Public/Granted literature
- US20100201975A1 DISK SURFACE INSPECTION APPARATUS, INSPECTION SYSTEM THEREOF, AND INSPECTION METHOD THEREOF Public/Granted day:2010-08-12
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