Invention Grant
US08253935B2 Disk surface inspection apparatus, inspection system thereof, and inspection method thereof 失效
磁盘表面检查装置及其检查系统及其检查方法

Disk surface inspection apparatus, inspection system thereof, and inspection method thereof
Abstract:
The invention has a function of preparing a data base for a relation between a defect shape and an arrangement for the optical system capable of detecting the shape at high sensitivity and automatically adjusting the arrangement for the optical system. As the method of preparing the data base, a method of using optical simulation or an experimental method of using a sample having an optical shape is applied. A pinhole position and a beam size are adjusted automatically so as to attain the optimal arrangement for the optical system to an inputted defect shape based on the data base.
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