Invention Grant
US08254197B2 Semiconductor memory device and self refresh test method 有权
半导体存储器件和自刷新测试方法

Semiconductor memory device and self refresh test method
Abstract:
A semiconductor memory device includes a memory cell array that includes a plurality of memory cells, an SR timer that determines a cycle of self refresh of the memory cell, a refresh counter that generates an internal address signal of the memory cell which is a target of the self refresh, and a circuit that outputs a pulse active signal to continuously execute refresh operation in one cycle of the self refresh.
Public/Granted literature
Information query
Patent Agency Ranking
0/0