Invention Grant
- Patent Title: Semiconductor memory device and self refresh test method
- Patent Title (中): 半导体存储器件和自刷新测试方法
-
Application No.: US12632225Application Date: 2009-12-07
-
Publication No.: US08254197B2Publication Date: 2012-08-28
- Inventor: Shinya Tashiiro , Keichiro Suga
- Applicant: Shinya Tashiiro , Keichiro Suga
- Applicant Address: JP Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Sughrue Mion, PLLC
- Priority: JP2008-311776 20081208
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
A semiconductor memory device includes a memory cell array that includes a plurality of memory cells, an SR timer that determines a cycle of self refresh of the memory cell, a refresh counter that generates an internal address signal of the memory cell which is a target of the self refresh, and a circuit that outputs a pulse active signal to continuously execute refresh operation in one cycle of the self refresh.
Public/Granted literature
- US20100142301A1 SEMICONDUCTOR MEMORY DEVICE AND SELF REFRESH TEST METHOD Public/Granted day:2010-06-10
Information query