Invention Grant
- Patent Title: Plasma doping device with gate shutter
- Patent Title (中): 带闸门的等离子体掺杂装置
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Application No.: US11887323Application Date: 2006-03-29
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Publication No.: US08257501B2Publication Date: 2012-09-04
- Inventor: Tomohiro Okumura , Yuichiro Sasaki , Katsumi Okashita , Bunji Mizuno , Hiroyuki Ito , Ichiro Nakayama , Cheng-Guo Jin
- Applicant: Tomohiro Okumura , Yuichiro Sasaki , Katsumi Okashita , Bunji Mizuno , Hiroyuki Ito , Ichiro Nakayama , Cheng-Guo Jin
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: McDermott Will & Emery LLP
- Priority: JP2005-099149 20050330
- International Application: PCT/JP2006/306561 WO 20060329
- International Announcement: WO2006/114976 WO 20061102
- Main IPC: C23C16/00
- IPC: C23C16/00

Abstract:
In a plasma doping device according to the invention, a vacuum chamber (1) is evacuated with a turbo-molecular pump (3) as an exhaust device via a exhaust port 11 while a predetermined gas is being introduced from a gas supply device (2) in order to maintain the inside of the vacuum chamber (1) to a predetermined pressure with a pressure regulating valve (4). A high-frequency power of 13.56 MHz is supplied by a high-frequency power source (5) to a coil (8) provided in the vicinity of a dielectric window (7) opposed to a sample electrode (6) to generate inductive-coupling plasma in the vacuum chamber (1). A high-frequency power source (10) for supplying a high-frequency power to the sample electrode (6) is provided. Uniformity of processing is enhanced by driving a gate shutter (18) and covering a through gate (16).
Public/Granted literature
- US20090176355A1 Plasma Doping Method and Plasma Processing Device Public/Granted day:2009-07-09
Information query
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