Invention Grant
- Patent Title: Extracellular potential measuring device and its manufacturing method
- Patent Title (中): 细胞外电位测定装置及其制造方法
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Application No.: US10513392Application Date: 2004-03-08
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Publication No.: US08257962B2Publication Date: 2012-09-04
- Inventor: Masaya Nakatani , Hiroaki Oka , Fumiaki Emoto
- Applicant: Masaya Nakatani , Hiroaki Oka , Fumiaki Emoto
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2003-062228 20030307; JP2003-062229 20030307
- International Application: PCT/JP2004/002951 WO 20040308
- International Announcement: WO2004/079354 WO 20040916
- Main IPC: C12M1/42
- IPC: C12M1/42 ; C12M3/00 ; C12N13/00

Abstract:
An extracellular potential measuring device includes a plate portion having a first surface and a second surface opposite to the first surface, and an electrode provided on the second surface of the plate portion. In the plate portion, a pocket having an opening which opens to the first surface is formed, and a through-hole communicating to the second surface from the pocket. The through-hole communicates from a position which is closer to the opening than a deepest point of the first pocket. The electrode is provided around of the opening of the through-hole. In this device, even if a cell to be examined does not reach the deepest point of the pocket, a cell membrane of the cell can tightly attaches onto the through-hole securely without a clearance. Hence, culture solution inside the through-hole is isolated from culture solution over an upper surface of the plate portion, thereby allowing electrochemical changes caused by activities of the cell to be detected efficiently with a detector electrode.
Public/Granted literature
- US20050221469A1 Extracellular potential measuring device and its manufacturing method Public/Granted day:2005-10-06
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