Invention Grant
- Patent Title: Isolated drain-centric lateral MOSFET
- Patent Title (中): 隔离漏极为中心的侧向MOSFET
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Application No.: US12807675Application Date: 2010-09-10
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Publication No.: US08258575B2Publication Date: 2012-09-04
- Inventor: Richard K. Williams , Donald Ray Disney , Wai Tien Chan
- Applicant: Richard K. Williams , Donald Ray Disney , Wai Tien Chan
- Applicant Address: US CA Santa Clara CN Hong Kong
- Assignee: Advanced Analogic Technologies, Inc.,Advanced Analogic Technologies (Hong Kong) Limited
- Current Assignee: Advanced Analogic Technologies, Inc.,Advanced Analogic Technologies (Hong Kong) Limited
- Current Assignee Address: US CA Santa Clara CN Hong Kong
- Agency: Patentability Associates
- Main IPC: H01L23/62
- IPC: H01L23/62

Abstract:
A lateral MOSFET formed in a substrate of a first conductivity type includes a gate formed atop a gate dielectric layer over a surface of the substrate, a drain region of a second conductivity type, a source region of a second conductivity type, and a body region of the first conductivity type which extends under the gate. The body region may have a non-monotonic vertical doping profile with a portion located deeper in the substrate having a higher doping concentration than a portion located shallower in the substrate. The lateral MOSFET is drain-centric, with the source region and a dielectric-filled trench surrounding the drain region.
Public/Granted literature
- US20110012196A1 Isolated drain-centric lateral MOSFET Public/Granted day:2011-01-20
Information query
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