An integrated circuit packaging apparatus includes a first conductive layer disposed between an integrated circuit die and a conductive die paddle. Bond wires connect the first conductive layer to the lead frame package and to the integrated circuit die. A first dielectric layer is disposed between the first conductive layer and the conductive die paddle such that the first conductive layer, the first dielectric layer, and the conductive die paddle provide bypass capacitance. A method for providing bypass capacitance and power routing for an integrated circuit packaging apparatus includes; depositing a first dielectric layer on a conductive die paddle, depositing a first conductive layer on the first dielectric layer, and connecting the first conductive layer to the lead frame package and to the integrated circuit die. The first conductive layer, the first dielectric layer, and the conductive die paddle cooperate to provide bypass capacitance.