Invention Grant
- Patent Title: Bonding structure and method for manufacturing same
- Patent Title (中): 粘结结构及其制造方法
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Application No.: US12964907Application Date: 2010-12-10
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Publication No.: US08258637B2Publication Date: 2012-09-04
- Inventor: Eiji Sakamoto , Shohei Hata
- Applicant: Eiji Sakamoto , Shohei Hata
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- Priority: JP2009-281118 20091211
- Main IPC: H01L23/29
- IPC: H01L23/29

Abstract:
A bonding structure that a bonding region can endure a high temperature environment and the bonding can be maintained with high reliability is provided as a bonding material capable of maintaining reliable bonding in high temperature environment in place of solder including Pb. In the bonding structure for a first member and a second member, solder and glass are used to bond the first member and the second member together and the glass seals the solder. Thereby, electrical conductivity is ensured and the outflow of melting solder in high temperatures can be inhibited to improve the durability.
Public/Granted literature
- US20110139856A1 BONDING STRUCTURE AND METHOD FOR MANUFACTURING SAME Public/Granted day:2011-06-16
Information query
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