Invention Grant
- Patent Title: System for testing electronic devices
- Patent Title (中): 电子设备测试系统
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Application No.: US12764974Application Date: 2010-04-22
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Publication No.: US08258796B2Publication Date: 2012-09-04
- Inventor: Chun-Chin Lai , Jiann-Chyi Rau
- Applicant: Chun-Chin Lai , Jiann-Chyi Rau
- Applicant Address: TW Tu-Cheng, New Taipei
- Assignee: Chi Mei Communication Systems, Inc.
- Current Assignee: Chi Mei Communication Systems, Inc.
- Current Assignee Address: TW Tu-Cheng, New Taipei
- Agency: Altis Law Group, Inc.
- Priority: CN200910309107 20091030
- Main IPC: H01H31/02
- IPC: H01H31/02
Abstract:
A system for testing an electronic device comprises a first output, a second output, and a third output connected to a positive input, an identification input, and a negative input of the electronic device, respectively. The system further comprises a switch comprising at least two dynamic contacts, each of which is connected to a resistor for the use of identification.
Public/Granted literature
- US20110101993A1 SYSTEM FOR TESTING ELECTRONIC DEVICES Public/Granted day:2011-05-05
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