Provided is a test apparatus for testing a device under test, including: a plurality of test modules that exchange signals with the device under test; a bus to which the plurality of test modules are connected; and a test control section that controls the plurality of test modules via the bus, where each of the plurality of test modules includes: a test section that exchanges signals with the device under test, and a module control section that controls the test section, and the module control section of each test module exchanges signals with the module control section of another test module, via the bus.