Invention Grant
US08258854B2 Devices and methods for reducing effects of device mismatch in temperature sensor circuits
有权
降低温度传感器电路中器件不匹配影响的器件和方法
- Patent Title: Devices and methods for reducing effects of device mismatch in temperature sensor circuits
- Patent Title (中): 降低温度传感器电路中器件不匹配影响的器件和方法
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Application No.: US12887226Application Date: 2010-09-21
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Publication No.: US08258854B2Publication Date: 2012-09-04
- Inventor: Dong Pan
- Applicant: Dong Pan
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: H01L37/00
- IPC: H01L37/00
Abstract:
A temperature sensor having one or more mirror circuits output temperature dependent output signals is disclosed in one embodiment. The temperature sensor includes a sampling circuit coupled to receive a clock signal that samples the output signals for a duration of a predetermined number of clock cycles. The temperature sensor additionally includes a phase control circuit that receives the clock signal and generates a control signal that enables subsequent sampling operations. Each subsequent sampling operation has a duration of the predetermined number of clock cycles. The control signal from the phase control circuit further enables input and output terminals of respective circuit components in the mirror circuits to be switched for each subsequent sampling operation.
Public/Granted literature
- US20110006831A1 DEVICES AND METHODS FOR REDUCING EFFECTS OF DEVICE MISMATCH IN TEMPERATURE SENSOR CIRCUITS Public/Granted day:2011-01-13
Information query
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