Invention Grant
- Patent Title: Optically testing chiplets in display device
- Patent Title (中): 在显示设备中光学测试小巧
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Application No.: US12544286Application Date: 2009-08-20
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Publication No.: US08259095B2Publication Date: 2012-09-04
- Inventor: Ronald S. Cok , John W. Hamer , Michael W. Mattern
- Applicant: Ronald S. Cok , John W. Hamer , Michael W. Mattern
- Applicant Address: US VA Herndon
- Assignee: Global OLED Technology LLC
- Current Assignee: Global OLED Technology LLC
- Current Assignee Address: US VA Herndon
- Agency: Morgan, Lewis & Bockius LLP
- Main IPC: G09G5/00
- IPC: G09G5/00

Abstract:
A method of making a display includes providing a display substrate having a plurality of control electrodes in a display area; locating a plurality of chiplets responsive to a controller to provide current to the control electrodes, each chiplet having a separate substrate, at least one pixel connection pad electrically connected to a control electrode, and one or more test light emitters formed in the chiplet responsive to the current provided on the control electrodes to emit light; controlling the chiplets to pass current through one or more of the test light emitters formed in the chiplet to emit light; detecting the light emitted by the test light emitters to determine faulty chiplets or chiplet interconnections; replacing or repairing the faulty chiplets or chiplet interconnections; and forming an organic light emitting diode over the substrate in the display area connected to the control electrodes.
Public/Granted literature
- US20110043499A1 OPTICALLY TESTING CHIPLETS IN DISPLAY DEVICE Public/Granted day:2011-02-24
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