Invention Grant
- Patent Title: Image quality assessment method and image quality assessment apparatus for display apparatus
- Patent Title (中): 显示设备的图像质量评估方法和图像质量评估装置
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Application No.: US12395844Application Date: 2009-03-02
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Publication No.: US08259181B2Publication Date: 2012-09-04
- Inventor: Tae-hee Kim
- Applicant: Tae-hee Kim
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2008-0062008 20080627
- Main IPC: H04N17/02
- IPC: H04N17/02 ; H04N17/00

Abstract:
An image quality assessment method and an image quality assessment apparatus are provided. In the image quality assessment method, the contrast of a measurement pattern displayed on the display apparatus, the brightness of the background, and the resolution are adjusted, and thereby the luminance characteristic of the measurement pattern is detected. Accordingly, the image quality of a display apparatus can be assessed using the number of waves determined from the luminance characteristic and the modulation transfer function (MTF) of the waves. Therefore, image quality assessment can be performed objectively by the display apparatus.
Public/Granted literature
- US20090322887A1 IMAGE QUALITY ASSESSMENT METHOD AND IMAGE QUALITY ASSESSMENT APPARATUS FOR DISPLAY APPARATUS Public/Granted day:2009-12-31
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