Invention Grant
US08259493B2 Nonvolatile semiconductor storage device and method of testing the same
失效
非易失性半导体存储器件及其测试方法
- Patent Title: Nonvolatile semiconductor storage device and method of testing the same
- Patent Title (中): 非易失性半导体存储器件及其测试方法
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Application No.: US12433173Application Date: 2009-04-30
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Publication No.: US08259493B2Publication Date: 2012-09-04
- Inventor: Hitoshi Ohta , Tomohito Kawano , Akira Umezawa
- Applicant: Hitoshi Ohta , Tomohito Kawano , Akira Umezawa
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2008-121633 20080507
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C16/04

Abstract:
A nonvolatile semiconductor storage device includes a memory cell array including a plurality of memory cells arranged at intersection positions of word lines and bit lines in a matrix form, and a row decoder including a row sub-decoder to which a lower address for selecting a word line is input, wherein one unit of the row sub-decoder for selecting one word line is constituted of a first transistor of a first conduction type, and a second transistor of a second conduction type, and a gate electrode of each of the first and second transistors is arranged in a direction in which the bit lines are arranged.
Public/Granted literature
- US20090279357A1 NONVOLATILE SEMICONDUCTOR STORAGE DEVICE AND METHOD OF TESTING THE SAME Public/Granted day:2009-11-12
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