Invention Grant
- Patent Title: Model-based correction of position measurements
- Patent Title (中): 基于模型的位置测量校正
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Application No.: US13100369Application Date: 2011-05-04
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Publication No.: US08260400B2Publication Date: 2012-09-04
- Inventor: Assaf Govari , Andres Claudio Altmann , Yaron Ephrath
- Applicant: Assaf Govari , Andres Claudio Altmann , Yaron Ephrath
- Applicant Address: US CA Diamond Bar
- Assignee: Biosense Webster, Inc.
- Current Assignee: Biosense Webster, Inc.
- Current Assignee Address: US CA Diamond Bar
- Agent Louis J. Capezzuto
- Main IPC: A61B5/05
- IPC: A61B5/05

Abstract:
Visualization of a probe when impedance-based measurement technology is being used is improved by stabilizing a displayed image of the probe or catheter. Using a model of reasonable probe shapes and a matching algorithm, an erroneous probe image is adjusted so that it assumes a realistic shape on a display. A range of positional variations is also incorporated in the model. When an apparent probe position exceeds a permissible range of motion, the probe image is constrained to a realistic position.
Public/Granted literature
- US20110213240A1 MODEL-BASED CORRECTION OF POSITION MEASUREMENTS Public/Granted day:2011-09-01
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